연속블록면 주사전자현미경
Serial Block-Face Scanning Electron MicroscopyMerlin Compact VP
기본정보
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| 등록번호 | NFEC-2015-06-203274 |
|---|---|
| 모델명 | Merlin Compact VP |
| 제작사 | Carl Zeiss |
| 설치장소 | 신경이미징센터 |
| 구축일자 | 2015-04-18 |
| 전자메뉴얼 | 연속블록면 주사전자현미경.pdf |
| 담당자 | 이상훈 (medilg@kbri.re.kr) |
동영상&장비사진
구성&기능
* Resolution: 1.6 nm at 1 kV 0.8 nm above 15 kV
* Acceleration voltage: 0.02 - 30 kV
* Magnification: 12 ~ 2,000.000x
* Aperture: 7, 10, 15, 20, 30, 60, 120 um
* Sample chamber: 330 mm and 270 mm
* Vacuum system
* Map large samples areas for design verification of cell and tissue structures with the ATLAS large area mapping module.
* Explore non-conducting samples with no compromises in beam voltage.
* Conveniently comprehend the topography and surface roughness of cell and tissue structures or scratch marks in forensic investigations with real time 3D-SEM imaging module.
